The parallel backlight source is a surface-emitting light source that effectively improves the parallelism of backlighting, eliminating the "virtual edge" phenomenon caused by non-parallel light, enhancing the edge contrast of the measured object in the image. This greatly facilitates the recognition of image processing software, improving measurement accuracy. It is commonly used for the detection of outer contours.
Applications of Parallel Backlight Source:
1. Outer contour measurement
2. Machining dimension measurement
3. Detection of glass bottle damage and foreign objects
4. Detection of scratches, stains, internal foreign objects, and damage on the surface of transparent objects.
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